Design of a portable optical emission tomography system for microwave induced compact plasma for visible to near-infrared emission lines

Journal Article · Tue Mar 15 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4942768· OSTI ID:22597079

Rathore, Kavita; Munshi, Prabhat ^[1]; Bhattacharjee, Sudeep ^[2]

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1. Nuclear Engineering and Technology Programme, Indian Institute of Technology Kanpur, Kanpur (India)
2. Department of Physics, Indian Institute of Technology Kanpur, Kanpur 208016 (India)

A new non-invasive diagnostic system is developed for Microwave Induced Plasma (MIP) to reconstruct tomographic images of a 2D emission profile. A compact MIP system has wide application in industry as well as research application such as thrusters for space propulsion, high current ion beams, and creation of negative ions for heating of fusion plasma. Emission profile depends on two crucial parameters, namely, the electron temperature and density (over the entire spatial extent) of the plasma system. Emission tomography provides basic understanding of plasmas and it is very useful to monitor internal structure of plasma phenomena without disturbing its actual processes. This paper presents development of a compact, modular, and versatile Optical Emission Tomography (OET) tool for a cylindrical, magnetically confined MIP system. It has eight slit-hole cameras and each consisting of a complementary metal–oxide–semiconductor linear image sensor for light detection. The optical noise is reduced by using aspheric lens and interference band-pass filters in each camera. The entire cylindrical plasma can be scanned with automated sliding ring mechanism arranged in fan-beam data collection geometry. The design of the camera includes a unique possibility to incorporate different filters to get the particular wavelength light from the plasma. This OET system includes selected band-pass filters for particular argon emission 750 nm, 772 nm, and 811 nm lines and hydrogen emission H{sub α} (656 nm) and H{sub β} (486 nm) lines. Convolution back projection algorithm is used to obtain the tomographic images of plasma emission line. The paper mainly focuses on (a) design of OET system in detail and (b) study of emission profile for 750 nm argon emission lines to validate the system design.

• OSTI ID: 22597079
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 3; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALGORITHMS
ANIONS
ARGON
CAMERAS
CYLINDRICAL CONFIGURATION
DESIGN
ELECTRON TEMPERATURE
ELECTRONS
EMISSION
FILTERS
HOLES
HYDROGEN
IMAGES
ION BEAMS
MICROWAVE RADIATION
OXIDES
PLASMA
SEMICONDUCTOR MATERIALS
THRUSTERS
TOMOGRAPHY