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Title: Field transients of coherent terahertz synchrotron radiation accessed via time-resolving and correlation techniques

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4943779· OSTI ID:22596914
;  [1];  [2]; ;  [3]; ;  [4]; ; ;  [5]
  1. Humboldt-Universität zu Berlin, Institute of Physics, Newtonstraße 15, 12489 Berlin (Germany)
  2. Institute of Optical Sensor Systems, German Aerospace Center (DLR), Rutherfordstrasse 29, 12489 Berlin (Germany)
  3. Physikalisch-Technische Bundesanstalt (PTB), Abbestraße 2-12, 10587 Berlin (Germany)
  4. Helmholz-Zentrum Berlin, Albert-Einstein-Str. 15, 12489 Berlin (Germany)
  5. Institute of Micro- and Nanoelectronic Systems, Karlsruhe Institute of Technology (KIT), Hertzstrasse 16, 76187 Karlsruhe (Germany)

Decaying oscillations of the electric field in repetitive pulses of coherent synchrotron radiation in the terahertz frequency range was evaluated by means of time-resolving and correlation techniques. Comparative analysis of real-time voltage transients of the electrical response and interferograms, which were obtained with an ultrafast zero-bias Schottky diode detector and a Martin-Puplett interferometer, delivers close values of the pulse duration. Consistent results were obtained via the correlation technique with a pair of Golay Cell detectors and a pair of resonant polarisation-sensitive superconducting detectors integrated on one chip. The duration of terahertz synchrotron pulses does not closely correlate with the duration of single-cycle electric field expected for the varying size of electron bunches. We largely attribute the difference to the charge density oscillations in electron bunches and to the low-frequency spectral cut-off imposed by both the synchrotron beamline and the coupling optics of our detectors.

OSTI ID:
22596914
Journal Information:
Journal of Applied Physics, Vol. 119, Issue 11; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English