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Buffer-eliminated, charge-neutral epitaxial graphene on oxidized 4H-SiC (0001) surface

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4953217· OSTI ID:22596766
 [1]
  1. Department of Physics, Southern Illinois University, Carbondale, Illinois 62901 (United States)

Buffer-eliminated, charge-neutral epitaxial graphene (EG) is important to enhance its potential in device applications. Using the first principles Density Functional Theory calculations, we investigated the effect of oxidation on the electronic and structural properties of EG on 4H-SiC (0001) surface. Our investigation reveals that the buffer layer decouples from the substrate in the presence of both silicate and silicon oxy-nitride at the interface, and the resultant monolayer EG is charge-neutral in both cases. The interface at 4H-SiC/silicate/EG is characterized by surface dangling electrons, which opens up another route for further engineering EG on 4H-SiC. Dangling electron-free 4H-SiC/silicon oxy-nitride/EG is ideal for achieving charge-neutral EG.

OSTI ID:
22596766
Journal Information:
Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 21 Vol. 119; ISSN JAPIAU; ISSN 0021-8979
Country of Publication:
United States
Language:
English