Time-dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U

Stutman, D.; Tritz, K.; Barbui, T.; Schmitz, O.

doi:10.1063/1.4955286

Time-dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U

Journal Article · Tue Nov 15 04:00:00 EST 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4955286· OSTI ID:22596637

Stutman, D.; Tritz, K. ^[1]; Barbui, T.; Schmitz, O. ^[2]

Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218 (United States)
Department of Engineering Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)

Helium line-ratios for electron temperature (T{sub e}) and density (n{sub e}) plasma diagnostic in the Scrape-Off-Layer (SOL) and edge regions of tokamaks are widely used. Due to their intensities and proximity of wavelengths, the singlet, 667.8 and 728.1 nm, and triplet, 706.5 nm, visible lines have been typically preferred. Time-dependency of the triplet line (706.5 nm) has been previously analyzed in detail by including transient effects on line-ratios during gas-puff diagnostic applications. In this work, several line-ratio combinations within each of the two spin systems are analyzed with the purpose of eliminating transient effects to extend the application of this powerful diagnostic to high temporal resolution characterization of plasmas. The analysis is done using synthetic emission modeling and diagnostic for low electron density NSTX SOL plasma conditions by several visible lines. Quasi-static equilibrium and time-dependent models are employed to evaluate transient effects of the atomic population levels that may affect the derived electron temperatures and densities as the helium gas-puff penetrates the plasma. The analysis of a wider range of spectral lines will help to extend this powerful diagnostic to experiments where the wavelength range of the measured spectra may be constrained either by limitations of the spectrometer or by other conflicting lines from different ions.

OSTI ID:: 22596637

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 11 Vol. 87; ISSN 0034-6748; ISSN RSINAK

Country of Publication:: United States

Language:: English

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Time dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U Bergos, J.; Barbui, T.; Schmitz, O. Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States) https://doi.org/10.11578/1366719	dataset	January 2016
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Cited By (3)

Time dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U Munoz Burgos, J. M.; Barbui, T.; Schmitz, O. Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States) https://doi.org/10.11578/1562066	dataset	January 2016
Invited Review Article: Gas puff imaging diagnostics of edge plasma turbulence in magnetic fusion devices Zweben, S. J.; Terry, J. L.; Stotler, D. P. Review of Scientific Instruments, Vol. 88, Issue 4 https://doi.org/10.1063/1.4981873	journal	April 2017
Time dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U Bergos, J.; Barbui, T.; Schmitz, O. Princeton Plasma Physics Laboratory (PPPL), Princeton, NJ (United States) https://doi.org/10.11578/1366719	dataset	January 2016

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46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
DENSITY
ELECTRON DENSITY
ELECTRON TEMPERATURE
ELECTRONS
HELIUM
IONS
NSTX DEVICE
PLASMA
PLASMA DENSITY
PLASMA DIAGNOSTICS
PLASMA SCRAPE-OFF LAYER
SIMULATION
SPECTROMETERS
SPIN
TIME DEPENDENCE
TRANSIENTS
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Time-dependent analysis of visible helium line-ratios for electron temperature and density diagnostic using synthetic simulations on NSTX-U

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References (12)

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