Control of secondary electrons from ion beam impact using a positive potential electrode

Journal Article · Tue Nov 15 00:00:00 EST 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4960170· OSTI ID:22596526

Demers, D. R.; Fimognari, P. J. ^[1]

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1. Xantho Technologies, LLC, Madison, Wisconsin 53705 (United States)

Secondary electrons emitted when an ion beam impacts a detector can amplify the ion beam signal, but also introduce errors if electrons from one detector propagate to another. A potassium ion beam and a detector comprised of ten impact wires, four split-plates, and a pair of biased electrodes were used to demonstrate that a low-voltage, positive electrode can be used to maintain the beneficial amplification effect while greatly reducing the error introduced from the electrons traveling between detector elements.

• OSTI ID: 22596526
• Journal Information: Review of Scientific Instruments, Vol. 87, Issue 11; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
AMPLIFICATION
CONTROL
ELECTRIC POTENTIAL
ELECTRODES
ELECTRONS
ERRORS
ION BEAMS
PLATES
POTASSIUM
POTASSIUM IONS
SECONDARY EMISSION
SIGNALS
WIRES