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Title: Kapitza thermal resistance studied by high-frequency photothermal radiometry

Abstract

Kapitza thermal resistance is determined using high-frequency photothermal radiometry (PTR) extended for modulation up to 10 MHz. Interfaces between 50 nm thick titanium coatings and silicon or stainless steel substrates are studied. In the used configuration, the PTR signal is not sensitive to the thermal conductivity of the film nor to its optical absorption coefficient, thus the Kapitza resistance is directly determined from single thermal parameter fits. Results of thermal resistances show the significant influence of the nature of the substrate, as well as of the presence of free electrons at the interface.

Authors:
; ;  [1];  [1];  [2];  [3]
  1. Multiscale Thermophysics Lab. GRESPI, Université de Reims Champagne Ardenne URCA, Moulin de la Housse, BP 1039, 51687 Reims (France)
  2. (MAE), Utah State University, 4130 Old Main Hill, Logan, Utah 84322-4130 (United States)
  3. Mechanical and Aerospace Engineering (MAE), Utah State University, 4130 Old Main Hill, Logan, Utah 84322-4130 (United States)
Publication Date:
OSTI Identifier:
22594475
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 109; Journal Issue: 3; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION; COATINGS; CONFIGURATION; ELECTRONS; FILMS; INTERFACES; KAPITZA RESISTANCE; MHZ RANGE 01-100; MODULATION; SIGNALS; SILICON; STAINLESS STEELS; SUBSTRATES; THERMAL CONDUCTIVITY; TITANIUM

Citation Formats

Horny, Nicolas, Chirtoc, Mihai, Hamaoui, Georges, Fleming, Austin, Mechanical and Aerospace Engineering, and Ban, Heng. Kapitza thermal resistance studied by high-frequency photothermal radiometry. United States: N. p., 2016. Web. doi:10.1063/1.4959084.
Horny, Nicolas, Chirtoc, Mihai, Hamaoui, Georges, Fleming, Austin, Mechanical and Aerospace Engineering, & Ban, Heng. Kapitza thermal resistance studied by high-frequency photothermal radiometry. United States. doi:10.1063/1.4959084.
Horny, Nicolas, Chirtoc, Mihai, Hamaoui, Georges, Fleming, Austin, Mechanical and Aerospace Engineering, and Ban, Heng. 2016. "Kapitza thermal resistance studied by high-frequency photothermal radiometry". United States. doi:10.1063/1.4959084.
@article{osti_22594475,
title = {Kapitza thermal resistance studied by high-frequency photothermal radiometry},
author = {Horny, Nicolas and Chirtoc, Mihai and Hamaoui, Georges and Fleming, Austin and Mechanical and Aerospace Engineering and Ban, Heng},
abstractNote = {Kapitza thermal resistance is determined using high-frequency photothermal radiometry (PTR) extended for modulation up to 10 MHz. Interfaces between 50 nm thick titanium coatings and silicon or stainless steel substrates are studied. In the used configuration, the PTR signal is not sensitive to the thermal conductivity of the film nor to its optical absorption coefficient, thus the Kapitza resistance is directly determined from single thermal parameter fits. Results of thermal resistances show the significant influence of the nature of the substrate, as well as of the presence of free electrons at the interface.},
doi = {10.1063/1.4959084},
journal = {Applied Physics Letters},
number = 3,
volume = 109,
place = {United States},
year = 2016,
month = 7
}
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