High pressure polymorphs and amorphization of upconversion host material NaY(WO{sub 4}){sub 2}

Journal Article · Mon Jul 25 04:00:00 EDT 2016 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4960104· OSTI ID:22594372

Hong, Fang; Yue, Binbin ^[1]; Cheng, Zhenxiang ^[2]; Kunz, Martin ^[3]; Chen, Bin ^[1]; Mao, Ho-Kwang ^[1]

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1. Center for High Pressure Science and Technology Advanced Research, 1690 Cailun Rd. Pudong, Shanghai 201203 (China)
2. Institute for Superconducting and Electronic Materials, Australian Institute of Innovative Materials, University of Wollongong, Innovation Campus, Squires Way, North Wollongong, NSW 2500 (Australia)
3. The Advanced Light Source, Lawrence Berkeley National Laboratory, 1 Cyclotron Rd, Berkeley, California 94720 (United States)

The pressure effect on the structural change of upconversion host material NaY(WO{sub 4}){sub 2} was studied by using in-situ synchrotron X-ray diffraction. A transition from the initial scheelite phase to the M-fergusonite phase occurs near 10 GPa, and another phase transition is found near 27.5 GPa, which could be an isostructural transition without symmetry change. The sample becomes amorphous when the pressure is fully released from high pressure. This work demonstrates the possibility of synthesizing various polymorph structures for non-linear optical applications with a high pressure, chemical doping, or strained thin-film nanostructure process.

• OSTI ID: 22594372
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 4 Vol. 109; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
AMORPHOUS STATE
NANOSTRUCTURES
NONLINEAR PROBLEMS
PHASE TRANSFORMATIONS
PRESSURE RANGE GIGA PA
STRAINS
SYMMETRY
SYNCHROTRONS
THIN FILMS
TUNGSTATES
X-RAY DIFFRACTION