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Ellipsometric investigation of ZnFe{sub 2}O{sub 4} thin films in relation to magnetic properties

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4944898· OSTI ID:22591499
; ; ; ;  [1]
  1. Universität Leipzig, Institut für Experimentelle Physik II, Linnéstr. 5, D-04103 Leipzig (Germany)

We report an influence of disorder on structural and magnetic properties of ZnFe{sub 2}O{sub 4} thin films grown at temperatures ranging from 400 °C to 600 °C by pulsed laser deposition in O{sub 2} atmosphere on SrTiO{sub 3} (100) substrates evidenced by properties of electronic transitions observed in the dielectric function. Inversion of the normal spinel structure was found to be one of the main mechanisms responsible for the increase in the magnetic response for the lowest growth temperature. The enhanced feature in the dielectric function located at ∼3.5 eV, related to the transition involving tetrahedrally coordinated Fe{sup 3+} cations, corresponds to the dominating magnetic coupling between the octahedral and tetrahedral lattice sites, responsible for the overall ferrimagnetic behaviour of the film grown at the lowest temperature.

OSTI ID:
22591499
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 13 Vol. 108; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English

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