Structural and magnetic properties of ion beam sputtered Co{sub 2}FeAl full Heusler alloy thin films

Journal Article · Fri May 06 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4946123· OSTI ID:22591261

Husain, Sajid; Chaudhary, Sujeet ^[1]; Kumar, Ankit; Svedlindh, Peter ^[2]

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1. Thin Film Laboratory (Spintronics), Indian Institute of Technology Delhi (India)
2. Department of Engineering Sciences, Uppsala University Sweden, 75121 Uppsala (Sweden)

Co{sub 2}FeAl full Heusler alloy thin films grown at different temperatures on Si(100) substrates using ion beam sputtering system have been investigated. X-ray diffraction (XRD) patterns revealed the A2 disordered phase in these films. The deduced lattice parameter slightly increases with increase in the growth temperature. The saturation magnetization it is found to increase with increase in growth temperature. The magnetic anisotropy has been studied using angle dependent magneto-optical Kerr effect. In the room temperature deposited film, the combination of cubic and uniaxial anisotropy have been observed with weak in-plane uniaxial anisotropy which increases with growth temperature. The uniaxial anisotropy is attributed to the anisotropic interfacial bonding in these Co{sub 2}FeAl /Si(100) heterostructures.

• OSTI ID: 22591261
• Journal Information: AIP Conference Proceedings, Vol. 1728, Issue 1; Conference: ICC 2015: International conference on condensed matter and applied physics, Bikaner (India), 30-31 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ANISOTROPY
COBALT BASE ALLOYS
CRYSTAL GROWTH
HETEROJUNCTIONS
HEUSLER ALLOYS
ION BEAMS
IRON ALLOYS
KERR EFFECT
LATTICE PARAMETERS
MAGNETIC PROPERTIES
MAGNETIZATION
SILICON
SPUTTERING
SUBSTRATES
TEMPERATURE DEPENDENCE
THIN FILMS
X-RAY DIFFRACTION