Effect of Ta concentration on the refractive index of TiO{sub 2}:Ta studied by spectroscopic ellipsometry
- Department of Physics, Institut Teknologi Bandung, Ganesa 10 Bandung 40132 (Indonesia)
We have investigated optical properties of Ta-doped TiO{sub 2} thin film on LaAlO{sub 3} (LAO) substrate using Spectroscopic Ellipsometry (SE) at room temperature. Amplitude ratio Ψ and phase difference L1 between p- and s- polarized light waves are obtained by multiple incident angles measurement (60°, 70°, and 80°) at energy range of 0.5 – 6.5 eV. In order to obtain optical properties for every Ta concentrations (0.01, 0.4, and 5 at. %), multilayer modelling was performed simultaneously by using Drude-Lorentz model. Refractive index and optical dispersion parameters were determined by Wemple-DiDomenico relation. In general, refractive index at zero photon energy n(0) increases by increasing Ta concentration. Furthermore, optical band gap shows a significant increasing due to presence of Ta dopant. In addition, other optical constants are discussed as well.
- OSTI ID:
- 22591154
- Journal Information:
- AIP Conference Proceedings, Vol. 1725, Issue 1; Conference: ICAMST 2015: 3. international conference on advanced materials science and technology, Semarang (Indonesia), 6-7 Oct 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
GENERAL PHYSICS
ALUMINATES
ANGULAR DISTRIBUTION
COMPUTERIZED SIMULATION
CONCENTRATION RATIO
DOPED MATERIALS
ELLIPSOMETRY
LANTHANUM OXIDES
LAYERS
OPTICAL DISPERSION
PHOTONS
REFRACTIVE INDEX
SUBSTRATES
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
TITANIUM OXIDES
VISIBLE RADIATION