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Title: Local and transient nanoscale strain mapping during in situ deformation

Abstract

The mobility of defects such as dislocations controls the mechanical properties of metals. This mobility is determined both by the characteristics of the defect and the material, as well as the local stress and strain applied to the defect. Therefore, the knowledge of the stress and strain during deformation at the scale of defects is important for understanding fundamental deformation mechanisms. Here, we demonstrate a method of measuring local stresses and strains during continuous in situ deformation with a resolution of a few nanometers using nanodiffraction strain mapping. Our results demonstrate how large multidimensional data sets captured with high speed electron detectors can be analyzed in multiple ways after an in situ TEM experiment, opening the door for true multimodal analysis from a single electron scattering experiment.

Authors:
;  [1]; ;  [1];  [2];  [3];  [4]
  1. National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
  2. (United States)
  3. Gatan, Inc., Pleasanton, California 94588 (United States)
  4. Hysitron, Inc., Minneapolis, Minnesota 55344 (United States)
Publication Date:
OSTI Identifier:
22590482
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 109; Journal Issue: 8; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DEFORMATION; DISLOCATIONS; MAPPING; MECHANICAL PROPERTIES; METALS; MOBILITY; NANOSTRUCTURES; RESOLUTION; SCATTERING; STRAINS; STRESSES; TRANSMISSION; TRANSMISSION ELECTRON MICROSCOPY

Citation Formats

Gammer, C., E-mail: christoph.gammer@oeaw.ac.at, E-mail: aminor@lbl.gov, Ciston, J., Kacher, J., Minor, A. M., E-mail: christoph.gammer@oeaw.ac.at, E-mail: aminor@lbl.gov, Department of Materials Science and Engineering, University of California, Berkeley, California 94720, Czarnik, C., and Warren, O. L. Local and transient nanoscale strain mapping during in situ deformation. United States: N. p., 2016. Web. doi:10.1063/1.4961683.
Gammer, C., E-mail: christoph.gammer@oeaw.ac.at, E-mail: aminor@lbl.gov, Ciston, J., Kacher, J., Minor, A. M., E-mail: christoph.gammer@oeaw.ac.at, E-mail: aminor@lbl.gov, Department of Materials Science and Engineering, University of California, Berkeley, California 94720, Czarnik, C., & Warren, O. L. Local and transient nanoscale strain mapping during in situ deformation. United States. doi:10.1063/1.4961683.
Gammer, C., E-mail: christoph.gammer@oeaw.ac.at, E-mail: aminor@lbl.gov, Ciston, J., Kacher, J., Minor, A. M., E-mail: christoph.gammer@oeaw.ac.at, E-mail: aminor@lbl.gov, Department of Materials Science and Engineering, University of California, Berkeley, California 94720, Czarnik, C., and Warren, O. L. Mon . "Local and transient nanoscale strain mapping during in situ deformation". United States. doi:10.1063/1.4961683.
@article{osti_22590482,
title = {Local and transient nanoscale strain mapping during in situ deformation},
author = {Gammer, C., E-mail: christoph.gammer@oeaw.ac.at, E-mail: aminor@lbl.gov and Ciston, J. and Kacher, J. and Minor, A. M., E-mail: christoph.gammer@oeaw.ac.at, E-mail: aminor@lbl.gov and Department of Materials Science and Engineering, University of California, Berkeley, California 94720 and Czarnik, C. and Warren, O. L.},
abstractNote = {The mobility of defects such as dislocations controls the mechanical properties of metals. This mobility is determined both by the characteristics of the defect and the material, as well as the local stress and strain applied to the defect. Therefore, the knowledge of the stress and strain during deformation at the scale of defects is important for understanding fundamental deformation mechanisms. Here, we demonstrate a method of measuring local stresses and strains during continuous in situ deformation with a resolution of a few nanometers using nanodiffraction strain mapping. Our results demonstrate how large multidimensional data sets captured with high speed electron detectors can be analyzed in multiple ways after an in situ TEM experiment, opening the door for true multimodal analysis from a single electron scattering experiment.},
doi = {10.1063/1.4961683},
journal = {Applied Physics Letters},
number = 8,
volume = 109,
place = {United States},
year = {Mon Aug 22 00:00:00 EDT 2016},
month = {Mon Aug 22 00:00:00 EDT 2016}
}