Determination of dislocation density by electron backscatter diffraction and X-ray line profile analysis in ferrous lath martensite

Journal Article · Tue Mar 15 04:00:00 EDT 2016 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2015.11.014· OSTI ID:22587117

Berecz, Tibor ^[1]; Jenei, Péter ^[2]; Csóré, András ^[1]; Lábár, János ^[3]; Gubicza, Jenő ^[2]; others, and

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1. Department of Materials Science and Engineering, Budapest University of Technology and Economics, 1111 Budapest, Bertalan Lajos utca 7 (Hungary)
2. Department of Materials Physics, Eötvös Loránd University, 1117 Budapest, Pázmány Péter sétány 1/a (Hungary)
3. Institute for Technical Physics and Materials Science, Centre for Energy Research, Hungarian Academy of Sciences, 1121 Budapest, Konkoly Thege Miklós út 29–33 (Hungary)

The microstructure and the dislocation density in as-quenched ferrous lath martensite were studied by different methods. The blocks, packets and variants formed due to martensitic transformation were identified and their sizes were determined by electron backscatter diffraction (EBSD). Concomitant transmission electron microscopy (TEM) investigation revealed that the laths contain subgrains with the size between 50 and 100 nm. A novel evaluation procedure of EBSD images was elaborated for the determination of the density and the space distribution of geometrically necessary dislocations from the misorientation distribution. The total dislocation density obtained by X-ray diffraction line profile analysis was in good agreement with the value determined by EBSD, indicating that the majority of dislocations formed due to martensitic transformation during quenching are geometrically necessary dislocations.

• OSTI ID: 22587117
• Journal Information: Materials Characterization, Journal Name: Materials Characterization Vol. 113; ISSN 1044-5803; ISSN MACHEX
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
BACKSCATTERING
DISLOCATIONS
ELECTRON DIFFRACTION
MARTENSITE
MICROSTRUCTURE
PHASE TRANSFORMATIONS
QUENCHING
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION