Synthesis, thermal and electrical properties of Al-doped Bi{sub 4}V{sub 1.8}Cu{sub 0.2}O{sub 10.7}
- Laboratoire des Sciences des Matériaux Inorganiques et leurs Applications (LASMIA), Equipe Matériaux à Faible Dimensionnalité(EMAFAD), Faculté des Sciences, Semlalia, Av. My Abdellah, B.P. 2390 Marrakech (Morocco)
Partial substitution of copper with aluminum in Bi{sub 4}V{sub 1.8}Cu{sub 0.2}O{sub 10.7} has led to the Bi{sub 4}V{sub 1.8}Cu{sub 0.2−x}Al{sub x}O{sub 10.7+x/2} solid solution. X-ray diffraction and thermal analysis have shown that the compounds with x=0.05 and x=0.10 are tetragonal with γ′ form of Bi{sub 4}V{sub 2}O{sub 11}, while the compound with x=0.15 is of β polymorph. The effect of Al{sup 3+} doping on electrical conductivity has been studied using Electrochemical Impedance Spectroscopy. The electrical conductivity of doped samples along with the amount of Al{sup 3+} has been studied by electrochemical impedance spectroscopy in the temperature range 250–700 °C. The slope changes observed in the Arrhenius plots agree with the microstructural transitions occurring in these compounds. The highest ionic conductivity values are obtained for the sample with x=0.05. - Graphical abstract: Arrhenius plots of the electrical conductivity of the of Bi{sub 4}V{sub 1.8}Cu{sub 0.2−x}Al{sub x}O{sub 10.7+x/2} compounds. Display Omitted.
- OSTI ID:
- 22584187
- Journal Information:
- Journal of Solid State Chemistry, Vol. 240; Other Information: Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
ALUMINIUM
ALUMINIUM IONS
COPPER
DOPED MATERIALS
ELECTRIC CONDUCTORS
ELECTROCHEMISTRY
IMPEDANCE
IONIC CONDUCTIVITY
MICROSTRUCTURE
SOLID SOLUTIONS
SOLIDS
SPECTROSCOPY
SYNTHESIS
TEMPERATURE RANGE
THERMAL ANALYSIS
VANADIUM
VANADIUM OXIDES
X RADIATION
X-RAY DIFFRACTION