Structural, photoconductivity, and dielectric studies of polythiophene-tin oxide nanocomposites

Journal Article · Thu Sep 15 00:00:00 EDT 2016 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2016.05.004· OSTI ID:22581624

Murugavel, S., E-mail: [e-mail]; Malathi, M., E-mail: [e-mail]

Highlights: • Synthesis of polythiophene-tin oxide nanocomposites confirmed by FTIR and EDAX. • SEM shows SnO{sub 2} nanoparticles embedded within polythiophene matrix. • Stability and isoelectric point suggest nanoparticle–matrix interaction. • High dielectric constant due to high Maxwell–Wagner interfacial polarization. - Abstract: Polythiophene-tinoxide (PT-SnO{sub 2}) nanocomposites were prepared by in situ chemical oxidative polymerization, in the presence of various concentrations of SnO{sub 2} nanoparticles. Samples were characterized by X-ray diffraction, Fourier-transform infrared spectroscopy, thermogravimetric analysis, X-ray photoelectron spectroscopy and Zeta potential measurements. Morphologies and elemental compositions were investigated by transmission electron microscopy, field-emission scanning electron microscopy and energy-dispersive X-ray spectroscopy. The photoconductivity of the nanocomposites was studied by field-dependent dark and photo conductivity measurements. Their dielectric properties were investigated using dielectric spectroscopy, in the frequency range of 1kHz–1 MHz. The results indicated that the SnO{sub 2} nanoparticles in the PT-SnO{sub 2} nanocomposite were responsible for its enhanced dielectric performance.

• OSTI ID: 22581624
• Journal Information: Materials Research Bulletin, Vol. 81; Other Information: Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CONCENTRATION RATIO
DIELECTRIC MATERIALS
FIELD EMISSION
FOURIER TRANSFORMATION
INFRARED SPECTRA
MATRIX MATERIALS
MHZ RANGE
NANOCOMPOSITES
NANOPARTICLES
PERMITTIVITY
PHASE STABILITY
PHOTOCONDUCTIVITY
POLYMERIZATION
SCANNING ELECTRON MICROSCOPY
THERMAL GRAVIMETRIC ANALYSIS
TIN OXIDES
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY
X-RAY SPECTROSCOPY