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Photoluminescence in solid solutions and thin films of tungstates CaWO{sub 4}-CdWO{sub 4}

Conference ·
OSTI ID:22531317
; ; ;  [1];  [2];  [3];  [4];  [5];  [1]
  1. University of Toulon, IM2NP, UMR CNRS 7334, La Garde, (France)
  2. Aix Marseille University, IM2NP, UMR CNRS, 7334, Marseille, (France)
  3. IBN ZOHR University, Faculty of sciences, Environment and Materials Laboratory, Agadir, (Morocco)
  4. CEA of Cadarache, DEN, Departement of reactors studies, experimental physics, Instrumentation Sensors and Dosimetry Laboratory, (France)
  5. Cesigma society, signals and systems, La Garde, (France)
In this study, we present two types of studies on the luminescence properties under UV and X-ray excitations of solid solutions Ca{sub 1-x}Cd{sub x}WO{sub 4} and of thin layers of CaWO{sub 4} and CdWO{sub 4}. These tungstate based solid solutions are susceptible to be integrated into new radiation sensors, in order to be used in different fields of applications such as reactor measurements, safeguards, homeland security, nuclear nondestructive assays, LINAC emission radiation measurement. However these complex materials were rarely investigated in the literature. One first objective of our studies was to establish correlations between luminescence efficiency, chemical substitution and the degree of crystallization resulting from elaboration conditions. A second objective will be to determine the efficiency of luminescence properties of thin layers of these materials. In the present work, we focus our attention on the role of chemical substitution on photon emissions under UV and X-ray irradiations. The luminescence spectra of Ca{sub 1-x}Cd{sub x}WO{sub 4} polycrystalline materials have been investigated at room temperature as a function of composition (0≤x≤1). In addition, we present a preliminary study of the luminescence of CaWO{sub 4} and CdWO{sub 4} thin layers: oscillations observed in the case of X-ray excitations in the luminescence spectra are discussed. (authors)
Research Organization:
Institute of Electrical and Electronics Engineers - IEEE, 3 Park Avenue, 17th Floor, New York, N.Y. 10016-5997 (United States)
OSTI ID:
22531317
Report Number(s):
ANIMMA--2015-IO-27
Country of Publication:
United States
Language:
English