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Magnetic structure determination for annealed Ni{sub 80}Fe{sub 20}/Ag multilayers using polarized-neutron reflectivity

Conference ·
OSTI ID:225305
; ;  [1];  [2]; ; ; ;  [3]
  1. National Inst. of Standards and Technology, Gaithersburg, MD (United States). Reactor Radiation Div.
  2. Univ. of Missouri, Columbia, MO (United States). Research Reactor Facility
  3. IBM Storage Systems Div., San Jose, CA (United States)
Sputtered Ni{sub 80}Fe{sub 20}/Ag multilayers, annealed post-growth, show giant magnetoresistive (GMR) effects at unusually low magnetic fields ({approx} 5 Oe). Structural characterization by cross-sectional TEM and x-ray diffraction indicates that the Ag preferentially diffuses into the Ni{sub 80}Fe{sub 20} layers at the interfaces. Using polarized-neutron specular reflectivity, the authors have obtained magnetization depth profiles for a series of annealed [Ni{sub 80}Fe{sub 20}(20{angstrom})/Ag(40{angstrom})]{sub 4} multilayers. Though GMR in related materials is associated with coherent antiferromagnetic alignment of the ferromagnetic layers, specular neutron data for the Ni{sub 80}Fe{sub 20}/Ag multilayers show no trace of half-order spin-flip intensity characteristic of this simple structure. In small applied fields, transverse scans at the half-order position show a broad feature which disappears upon saturation. These data suggest that while the Ni{sub 80}Fe{sub 20} moments are antiferromagnetically correlated along the growth axis, the in-plane magnetic domains are only of micron-order size and are thus not apparent in a specular measurement.
OSTI ID:
225305
Report Number(s):
CONF-941144--; ISBN 1-55899-278-2
Country of Publication:
United States
Language:
English