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Crystallographic analysis of the solid-state dewetting of polycrystalline gold film using automated indexing in a transmission electron microscope

Journal Article · · APL Materials
DOI:https://doi.org/10.1063/1.4937432· OSTI ID:22499224

We analyzed the effect of crystallographic anisotropy on the morphological evolution of a 12-nm-thick gold film during solid-state dewetting at high temperatures using automated indexing tool in a transmission electron microscopy. Dewetting initiated at grain-boundary triple junctions adjacent to large grains resulting from abnormal grain growth driven by (111) texture development. Voids at the junctions developed shapes with faceted edges bounded by low-index crystal planes. The kinetic mobility of the edges varied with the crystal orientation normal to the edges, with a predominance of specific edges with the slowest retraction rates as the annealing time was increased.

OSTI ID:
22499224
Journal Information:
APL Materials, Journal Name: APL Materials Journal Issue: 12 Vol. 3; ISSN 2166-532X; ISSN AMPADS
Country of Publication:
United States
Language:
English

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