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Title: Gamma and x-ray irradiation effects on different Ge and Ge/F doped optical fibers

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4929458· OSTI ID:22494815
; ; ;  [1];  [1]; ;  [2]; ;  [3]; ;  [4]
  1. Laboratoire H. Curien, UMR CNRS 5516, Université de Lyon, 18 rue du Pr. Benoît Lauras, 42000 Saint-Etienne (France)
  2. Materials Research Laboratory, University of Nova Gorica, Vipavska 11c, 5270 Ajdovscina (Slovenia)
  3. Dipartimento di Fisica e Chimica, Università di Palermo, I-90123 Palermo (Italy)
  4. CEA, DAM, DIF, F-91297 Arpajon (France)

We performed electron paramagnetic resonance (EPR) measurements on γ and X ray irradiated Ge doped and Ge/F co-doped optical fibers. We considered three different drawing conditions (speed and tension), and for each type of drawing, we studied Ge and Ge/F doped samples having Ge doping level above 4% by weight. The EPR data recorded for the γ ray irradiated fibers confirm that all the samples exhibit a very close radiation response regardless of the drawing conditions corresponding to values used for the production of specialty fibers. Furthermore, as for the X irradiated materials, in the γ ray irradiated F co-doped fibers, we observed that the Ge(1) and the Ge(2) defects generation is unchanged, whereas it was enhanced for the E'Ge. In the various fibers, the comparison of the γ and X-ray induced concentrations of these kinds of Ge related defects indicates that the two irradiations induce similar effects regardless of the different employed dose rates and sources. Confocal microscopy luminescence results show that the starting content of the Germanium Lone Pair Center (GLPC) is neither strongly affected by the Ge content nor by the drawing conditions, and we consider the similarity of the GLPC content as key factor in determining many of the above reported similarities.

OSTI ID:
22494815
Journal Information:
Journal of Applied Physics, Vol. 118, Issue 8; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English

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