Local structure analysis of diluted magnetic semiconductor Co and Al co-doped ZnO nanoparticles

Journal Article · Mon Feb 01 04:00:00 EST 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4941203· OSTI ID:22494581

Hyodo, K.; Morimoto, S.; Yamazaki, T.; Ishikawa, T.; Ichiyanagi, Y. ^[1]; Utsumi, J. ^[2]

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1. Department of Physics, Graduate School of Engineering, Yokohama National University, 79-5 Tokiwadai, Hodogaya, Yokohama, Kanagawa 240-8501 (Japan)
2. Engineering Department Machine Tool Division, Machinery, Equipment & Infrastructure, Mitsubishi Heavy Industries, Ltd., Ritto, Shiga 520-3080 (Japan)

In this study, Co and Al ions co-doped ZnO nanoparticles (Zn(Al, Co)O NPs) were prepared by our original chemical preparation method. The obtained samples prepared by this method, were encapsulated in amorphous SiO{sub 2}. X-ray diffraction (XRD) results showed Zn(Al, Co)O NPs had a single-phase nature with hexagonal wurtzite structure. These particle sizes could be controlled to be approximately 30 nm. We investigate the effect that the increase in the carrier has on the magnetization by doping Al to Co-doped ZnO NPs. The local structures were qualitatively analyzed using X-ray absorption fine structure (XAFS) measurements.

• OSTI ID: 22494581
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1709; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ABSORPTION
ABSORPTION SPECTROSCOPY
ALUMINIUM IONS
CARRIERS
CHEMICAL PREPARATION
DOPED MATERIALS
FINE STRUCTURE
MAGNETIC SEMICONDUCTORS
MAGNETIZATION
NANOPARTICLES
PARTICLE SIZE
SILICON OXIDES
X RADIATION
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY
ZINC OXIDES