skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: A full-field transmission x-ray microscope for time-resolved imaging of magnetic nanostructures

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4937499· OSTI ID:22494376
; ; ; ; ;  [1]; ; ;  [2];  [3];  [4];  [2]
  1. Institute for X-Optics (IXO), Hochschule Koblenz, Joseph-Rovan-Allee 2, 53424 Remagen (Germany)
  2. The Hamburg Centre for Ultrafast Imaging (CUI), University of Hamburg, Luruper Chaussee 149, 22761 Hamburg (Germany)
  3. Institut für Angewandte Physik, University of Hamburg, Jungiusstraße 11, 20355 Hamburg (Germany)
  4. Deutsches Elektronen-Synchrotron (DESY), Notkestraße 85, 22607 Hamburg (Germany)

Sub-nanosecond magnetization dynamics of small permalloy (Ni{sub 80}Fe{sub 20}) elements has been investigated with a new full-field transmission microscope at the soft X-ray beamline P04 of the high brilliance synchrotron radiation source PETRA III. The soft X-ray microscope generates a flat-top illumination field of 20 μm diameter using a grating condenser. A tilted nanostructured magnetic sample can be excited by a picosecond electric current pulse via a coplanar waveguide. The transmitted light of the sample plane is directly imaged by a micro zone plate with < 65 nm resolution onto a 2D gateable X-ray detector to select one particular bunch in the storage ring that probes the time evolution of the dynamic information successively via XMCD spectromicroscopy in a pump-probe scheme. In the experiments it was possible to generate a homogeneously magnetized state in patterned magnetic layers by a strong magnetic Oersted field pulse of 200 ps duration and directly observe the recovery to the initial flux-closure vortex patterns.

OSTI ID:
22494376
Journal Information:
AIP Conference Proceedings, Vol. 1696, Issue 1; Conference: XRM 2014: 12. international conference on X-ray microscopy, Melbourne (Australia), 26-31 Oct 2014; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English