Electron beam induced growth of tin whiskers

Journal Article · Mon Sep 28 04:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4931426· OSTI ID:22492745

Vasko, A. C.; Karpov, V. G. ^[1]; Warrell, G. R.; Parsai, E. I.; Shvydka, Diana ^[2]

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1. Department of Physics and Astronomy, University of Toledo, Toledo, Ohio 43606 (United States)
2. Department of Radiation Oncology, University of Toledo Health Science Campus, Toledo, Ohio 43614 (United States)

We have investigated the influence of electron irradiation on tin whisker growth. Sputtered tin samples exposed to electron beam of 6 MeV energy exhibited fast whisker growth, while control samples did not grow any whiskers. The statistics of e-beam induced whiskers was found to follow the log-normal distribution. The observed accelerated whisker growth is attributed to electrostatic effects due to charges trapped in an insulating substrate. These results offer promise for establishing whisker-related accelerated life testing protocols.

• OSTI ID: 22492745
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 12 Vol. 118; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DISTRIBUTION
ELECTRON BEAMS
IRRADIATION
MEV RANGE 01-10
SPUTTERING
STATISTICS
SUBSTRATES
TIN
TRAPPING
WHISKERS