Exfoliation of graphene oxide and its application in improving the electro-optical response of ferroelectric liquid crystal

Journal Article · Mon Sep 21 04:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4930949· OSTI ID:22489504

Kumar, Veeresh ^[1]; Kumar, Ajay ^[2]; Bhandari, Shruti; Biradar, A. M.; Pasricha, Renu ^[1]; Reddy, G. B. ^[3]

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1. CSIR-National Physical Laboratory, Dr K S Krishnan Road, New Delhi 110012 (India)
2. Department of Physics, Deshbandhu College, University of Delhi, Delhi 110019 (India)
3. Department of Physics, Indian Institute of Technology, New Delhi 110016 (India)

Near complete exfoliation and reduction of lyophilized graphene oxide (GO) has been carried out at temperature as low as 400 °C. The structural characterizations of the reduced GO have been performed using X-ray diffraction, Fourier transform infrared spectroscopy, and Raman spectroscopy techniques. The morphological studies were carried out using scanning electron microscopy. The synthesized GO finds an application in improving the switching performance of a liquid crystal (LC) mixture by remarkably modifying the physical properties, such as spontaneous polarization and rotational viscosity of the ferroelectric LC (FLC) material which in turn resulted into faster response of the FLC. The present study explores the possibility of low temperature thermal reduction of GO along with its application in improving the properties of LC based display systems.

• OSTI ID: 22489504
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 11 Vol. 118; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
FERROELECTRIC MATERIALS
FOURIER TRANSFORM SPECTROMETERS
GRAPHENE
LIQUID CRYSTALS
MIXTURES
OXIDES
PERFORMANCE
PHYSICAL PROPERTIES
POLARIZATION
RAMAN SPECTROSCOPY
SCANNING ELECTRON MICROSCOPY
VISCOSITY
X-RAY DIFFRACTION