Impact of crystalline defects and size on X-ray line broadening: A phenomenological approach for tetragonal SnO{sub 2} nanocrystals

Journal Article · Fri May 15 00:00:00 EDT 2015 · AIP Advances

DOI:https://doi.org/10.1063/1.4921452· OSTI ID:22488580

Muhammed Shafi, P.

Nanocrystalline tin oxide (SnO{sub 2}) powders with different grain size were prepared by chemical precipitation method. The reaction was carried out by varying the period of hydrolysis and the as-prepared samples were annealed at different temperatures. The samples were characterized using X-ray powder diffractometer and transmission electron microscopy. The microstrain and crystallite size were calculated for all the samples by using Williamson-Hall (W-H) models namely, isotropic strain model (ISM), anisotropic strain model (ASM) and uniform deformation energy density model (UDEDM). The morphology and particle size were determined using TEM micrographs. The directional dependant young’s modulus was modified as an equation relating elastic compliances (s{sub ij}) and Miller indices of the lattice plane (hkl) for tetragonal crystal system and also the equation for elastic compliance in terms of stiffness constants was derived. The changes in crystallite size and microstrain due to lattice defects were observed while varying the hydrolysis time and the annealing temperature. The dependence of crystallite size on lattice strain was studied. The results were correlated with the available studies on electrical properties using impedance spectroscopy.

• OSTI ID: 22488580
• Journal Information: AIP Advances, Vol. 5, Issue 5; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 2158-3226
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
CRYSTAL DEFECTS
CRYSTALS
DEFORMATION
ELECTRICAL PROPERTIES
ENERGY DENSITY
GRAIN SIZE
HYDROLYSIS
IMPEDANCE
LINE BROADENING
MORPHOLOGY
NANOSTRUCTURES
PARTICLE SIZE
POWDERS
PRECIPITATION
SPECTROSCOPY
STRAINS
TIN OXIDES
TRANSMISSION ELECTRON MICROSCOPY
X RADIATION