Exploring hardness enhancement in superhard tungsten tetraboride-based solid solutions using radial X-ray diffraction

Journal Article · Mon Jul 27 04:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4927596· OSTI ID:22486375

Xie, Miao; Turner, Christopher L. ^[1]; Mohammadi, Reza ^[1]; Kavner, Abby ^[2]

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1. Department of Chemistry and Biochemistry, UCLA, Los Angeles, California 90095 (United States)
2. Department of Earth, Planetary, and Space Sciences, UCLA, Los Angeles, California 90095 (United States)

In this work, we explore the hardening mechanisms in WB{sub 4}-based solid solutions upon addition of Ta, Mn, and Cr using in situ radial X-ray diffraction techniques under non-hydrostatic pressure. By examining the lattice-supported differential strain, we provide insights into the mechanism for hardness increase in binary solid solutions at low dopant concentrations. Speculations on the combined effects of electronic structure and atomic size in ternary WB{sub 4} solid solutions containing Ta with Mn or Cr are also included to understand the extremely high hardness of these materials.

• OSTI ID: 22486375
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 4 Vol. 107; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ELECTRONIC STRUCTURE
HARDENING
HARDNESS
MATERIALS
SOLID SOLUTIONS
STRAINS
TUNGSTEN
X-RAY DIFFRACTION