High energy-storage performance of 0.9Pb(Mg{sub 1/3}Nb{sub 2/3})O{sub 3}-0.1PbTiO{sub 3} relaxor ferroelectric thin films prepared by RF magnetron sputtering

Journal Article · Fri May 15 04:00:00 EDT 2015 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2015.01.038· OSTI ID:22475759

Wang, Xiaolin; Zhang, Le; Hao, Xihong; An, Shengli

Highlights: • High-quality PMN-PT 90/10 RFE thin films were prepared by RF magnetron sputtering. • The maximum discharged density of 31.3 J/cm{sup 3} was obtained in the 750-nm-thick film. • PMN-PT RFE films might be a promising material for energy-storage application. - Abstract: 0.9Pb(Mg{sub 1/3}Nb{sub 2/3})O{sub 3}-0.1PbTiO{sub 3} (PMN-PT 90/10) relaxor ferroelectric thin films with different thicknesses were deposited on the LaNiO{sub 3}/Si (100) by the radio-frequency (RF) magnetron sputtering technique. The effects of thickness and deposition temperature on the microstructure, dielectric properties and the energy-storage performance of the thin films were investigated in detail. X-ray diffraction spectra indicated that the thin films had crystallized into a pure perovskite phase with a (100)-preferred orientation after annealed at 700 °C. Moreover, all the PMN-PT 90/10 thin films showed the uniform and crack-free surface microstructure. As a result, a larger recoverable energy density of 31.3 J/cm{sup 3} was achieved in the 750-nm-thick film under 2640 kV/cm at room temperature. Thus, PMN-PT 90/10 relaxor thin films are the promising candidate for energy-storage capacitor application.

• OSTI ID: 22475759
• Journal Information: Materials Research Bulletin, Journal Name: Materials Research Bulletin Vol. 65; ISSN MRBUAC; ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
CRACKS
DEPOSITION
DIELECTRIC PROPERTIES
ENERGY STORAGE
FERROELECTRIC MATERIALS
GRAIN ORIENTATION
LEAD COMPOUNDS
MAGNESIUM COMPOUNDS
MAGNETRONS
NIOBATES
NIOBIUM COMPOUNDS
OXYGEN COMPOUNDS
PERFORMANCE
PEROVSKITE
SPECTRA
SURFACES
TEMPERATURE RANGE 0273-0400 K
THIN FILMS
X-RAY DIFFRACTION