Increase in the Shockley–Read–Hall recombination rate in InGaN/GaN QWs as the main mechanism of the efficiency droop in LEDs at high injection levels
It is shown that the efficiency droop observed as the current through a GaN-based light-emitting diode increases is due to a decrease in the Shockley–Read–Hall nonradiative lifetime. The lifetime decreases with increasing current because a steadily growing number of traps in the density-of-states tails of InGaN/GaN quantum wells become nonradiative recombination centers upon the approach of quasi-Fermi levels to the band edges. This follows from the correlation between the efficiency droop and the appearance of negative differential capacitance, observed in the study. The correlation appears due to slow trap recharging via the trap-assisted tunneling of electrons through the n-type barrier of the quantum well and to the inductive nature of the diode-current variation with forward bias.
- OSTI ID:
- 22469668
- Journal Information:
- Semiconductors, Journal Name: Semiconductors Journal Issue: 12 Vol. 49; ISSN SMICES; ISSN 1063-7826
- Country of Publication:
- United States
- Language:
- English
Similar Records
Efficiency droop in GaN LEDs at high injection levels: Role of hydrogen
Influence of trap-assisted and intrinsic Auger–Meitner recombination on efficiency droop in green InGaN/GaN LEDs
Journal Article
·
Sat Oct 15 00:00:00 EDT 2016
· Semiconductors
·
OSTI ID:22649685
Influence of trap-assisted and intrinsic Auger–Meitner recombination on efficiency droop in green InGaN/GaN LEDs
Journal Article
·
Mon Sep 11 20:00:00 EDT 2023
· Applied Physics Letters
·
OSTI ID:2007817