Structural phase transition of ternary dielectric SmGdO{sub 3}: Evidence from angle dispersive x-ray diffraction and Raman spectroscopic studies

Journal Article · Sat Mar 07 04:00:00 EST 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4913776· OSTI ID:22413209

Sharma, Yogesh; Sahoo, Satyaprakash; Misra, Pankaj; Pavunny, Shojan P.; Mishra, A. K.; Dwivedi, Abhilash; Sharma, S. M. ^[1]

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1. High Pressure and Synchrotron Radiation Physics Division, Bhabha Atomic Research Centre, Mumbai (India)

High-pressure synchrotron based angle dispersive x-ray diffraction (ADXRD) studies were carried out on SmGdO{sub 3} (SGO) up to 25.7 GPa at room temperature. ADXRD results indicated a reversible pressure-induced phase transition from ambient monoclinic to hexagonal phase at ∼8.9 GPa. The observed pressure-volume data were fitted with the third order Birch-Murnaghan equation of state yielding zero pressure bulk modulus B{sub 0} = 132(22) and 177(9) GPa for monoclinic (B-type) and hexagonal (A-type) phases, respectively. Pressure dependent micro-Raman spectroscopy further confirmed the monoclinic to hexagonal phase transition at about 5.24 GPa. The mode Grüneisen parameters and pressure coefficients for different Raman modes corresponding to each individual phases of SGO were calculated using pressure dependent Raman mode analysis.

• OSTI ID: 22413209
• Journal Information: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 9 Vol. 117; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIELECTRIC MATERIALS
EQUATIONS OF STATE
GADOLINIUM OXIDES
HEXAGONAL LATTICES
MONOCLINIC LATTICES
PHASE TRANSFORMATIONS
PRESSURE COEFFICIENT
PRESSURE DEPENDENCE
RAMAN SPECTROSCOPY
SAMARIUM COMPOUNDS
TEMPERATURE RANGE 0273-0400 K
ULTIMATE STRENGTH
X-RAY DIFFRACTION