Resistive switching properties in CdZnTe films
- State Key Laboratory of Solidification Processing, Northwestern Polytechnical University, Xi'an 710072 (China)
- Department of Materials Science and Engineering, Beijing Institute of Petrochemical Technology, Beijing 102617 (China)
The ternary II–VI compound semiconductor cadmium zinc telluride (CdZnTe) has bi-stable conduction characteristics. In this letter, CdZnTe films are grown on indium tin oxide (ITO) substrates by radio frequency magnetron sputtering. The current-voltage characteristics show that there is resistive switching in a structure consisting of an 800-nm-thick CdZnTe film, an Au Schottky contact, and an ITO bottom electrode. The electroresistance in Au/CdZnTe/ITO may be related to the polarization of the CdZnTe film and the Schottky contact.
- OSTI ID:
- 22412611
- Journal Information:
- Applied Physics Letters, Vol. 106, Issue 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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