Effect of L1{sub 2} ordering in antiferromagnetic Ir-Mn epitaxial layer on exchange bias of FePd films
Journal Article
·
· Journal of Applied Physics
- Department of Materials Science and Engineering, Feng Chia University, Taichung 407, Taiwan (China)
- National Synchrotron Radiation Research Center, Hsinchu 300, Taiwan (China)
- Department of Power Mechanical Engineering, National Tsing Hua University, Hsinchu 300, Taiwan (China)
Two series of samples of single-layer IrMn and IrMn/FePd bilayer films, deposited on a single-crystal MgO substrate at different IrMn deposition temperatures (T{sub s} = 300–700 °C), were investigated using magnetron sputtering. L1{sub 2} ordering was revealed for the 30 nm-thick IrMn epitaxial (001) films with T{sub s} ≥ 400 °C, determined by synchrotron radiation x-ray diffractometry (XRD). XRD results also provide evidence of the epitaxial growth of the IrMn films on MgO substrate. Increasing T{sub s} from 400 to 700 °C monotonically increases the ordering parameter of L1{sub 2} phases from 0.17 to 0.81. An in-plane exchange bias field (H{sub eb}) of 22 Oe is obtained in a 10 nm-thick FePd film that is deposited on the disordered IrMn films. As the L1{sub 2} ordering of the IrMn layers increases, the H{sub eb} gradually decreases to 0 Oe, meaning that the exchange bias behavior vanishes. The increased surface roughness, revealed by atomic force microscopy, of the epitaxial IrMn layers with increasing T{sub s} cannot be the main cause of the decrease in H{sub eb} due to the compensated surface spins regardless of the disordered and ordered (001) IrMn layers. The change of antiferromagnetic structure from the A1 to the L1{sub 2} phase was correlated with the evolution of H{sub eb}.
- OSTI ID:
- 22410076
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 17 Vol. 117; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIFERROMAGNETISM
ATOMIC FORCE MICROSCOPY
DEPOSITION
EPITAXY
FILMS
INTERMETALLIC COMPOUNDS
IRIDIUM
LAYERS
MAGNESIUM OXIDES
MANGANESE
MONOCRYSTALS
ROUGHNESS
SPUTTERING
SUBSTRATES
SURFACES
SYNCHROTRON RADIATION
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ANTIFERROMAGNETISM
ATOMIC FORCE MICROSCOPY
DEPOSITION
EPITAXY
FILMS
INTERMETALLIC COMPOUNDS
IRIDIUM
LAYERS
MAGNESIUM OXIDES
MANGANESE
MONOCRYSTALS
ROUGHNESS
SPUTTERING
SUBSTRATES
SURFACES
SYNCHROTRON RADIATION
TEMPERATURE DEPENDENCE
X-RAY DIFFRACTION