Identification of sub-grains and low angle boundaries beyond the angular resolution of EBSD maps

Journal Article · Mon Dec 15 00:00:00 EST 2014 · Materials Characterization

DOI:https://doi.org/10.1016/J.MATCHAR.2014.10.007· OSTI ID:22403603

Kratsch, D. ^[1]; Salib, M. ^[2]; Gey, N. ^[2]

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1. Laboratoire d'Informatique Théorique et Appliquée (LITA), EA3079, Université de Lorraine, 57045 Metz Cedex 1 (France)
2. Laboratoire d'Etude des Microstructures et de Mécanique des Matériaux (LEM3), UMR 7239, CNRS/Université de Lorraine, F-57045 Metz (France)

A new method called ALGrId (Anti-Leak GRain IDentification) is proposed for the detection of sub-grains beyond the relative angular resolution of Electron Backscatter Diffraction maps. It does not use any additional information such as Kikuchi Pattern Quality map nor need data filtering. It uses a modified Dijkstra algorithm which seeks the continuous set of boundaries having the highest average disorientation angle. - Highlights: • ALGrId is a new method to identify sub-grains and low angle boundaries in EBSD maps. • Unlike classical methods, ALGrId works even beyond the relative angular resolution. • If the orientation noise peaks at 0.7°, ALGrid detects 0.4°-boundaries correctly. • In the same example, the classical algorithm identifies 1.1°-boundaries only.

• OSTI ID: 22403603
• Journal Information: Materials Characterization, Vol. 98; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ALGORITHMS
BACKSCATTERING
DETECTION
ELECTRON DIFFRACTION
GRAIN BOUNDARIES
KIKUCHI LINES
NOISE
ORIENTATION
RESOLUTION