Automated crystal orientation and phase mapping in TEM
Journal Article
·
· Materials Characterization
The paper describes an automated crystal orientation and phase mapping technique that allows nanoscale characterization of crystalline materials with a transmission electron microscope. The template matching strategy used to identify the diffraction patterns is detailed and the resulting outputs of the technique are illustrated. Some examples of applications are used to demonstrate the capability of the tool and potential developments are discussed.
- OSTI ID:
- 22403598
- Journal Information:
- Materials Characterization, Vol. 98; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
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