Coherent diffractive imaging of single layer microspheres

Journal Article · Tue Apr 28 00:00:00 EDT 2015 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4919074· OSTI ID:22402901

Le, Hoang Vu; Van Vuong, Cuong; Hannaford, Peter; Van Dao, Lap ^[1]; Ong, Adabelle X. P.; Henderson, Clare A.; Smith, Trevor A. ^[2]

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1. Centre for Quantum and Optical Science, Swinburne University of Technology, Melbourne, Victoria 3122 (Australia)
2. Ultrafast and Microspectroscopy Laboratories, School of Chemistry, University of Melbourne, Victoria 3010 (Australia)

We report the extreme ultraviolet (XUV) coherent diffractive imaging of silica/polymer micro-particle samples illuminated by a table-top high harmonic generation source at the wavelength of 30 nm. We achieve images constructed from diffraction patterns acquired with 13 μm × 13 μm samples comprising a sparse monolayer of spherical silica and polymer micro-particles. Successful reconstructed image of an aperiodic sample using this HHG source will open the path to the realization of a compact soft x-ray microscope to investigate other complex absorbing samples.

• OSTI ID: 22402901
• Journal Information: Journal of Applied Physics, Vol. 117, Issue 16; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DIFFRACTION
EXTREME ULTRAVIOLET RADIATION
HARMONIC GENERATION
IMAGES
MICROSPHERES
PARTICLES
POLYMERS
SILICA
SOFT X RADIATION
SPHERICAL CONFIGURATION
WAVELENGTHS