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Title: Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers

Abstract

Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever’s spring constant and hence the overall precision of the method? This question is addressed in this note. Its answer enables manufacturers to specify of a single set of data for the spring constant, resonant frequency, and quality factor, from measurements on multiple reference cantilevers. With this data set, users can trivially calibrate cantilevers of the same type.

Authors:
 [1];  [2]
  1. School of Mathematics and Statistics, The University of Melbourne, Victoria 3010 (Australia)
  2. Department of Mechanical and Aerospace Engineering, University of California-San Diego, La Jolla, California 92093 (United States)
Publication Date:
OSTI Identifier:
22392521
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 5; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACCURACY; ATOMIC FORCE MICROSCOPY; CALIBRATION; MANUFACTURERS; QUALITY FACTOR; SPRINGS

Citation Formats

Sader, John E., E-mail: jsader@unimelb.edu.au, and Friend, James R. Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers. United States: N. p., 2015. Web. doi:10.1063/1.4921192.
Sader, John E., E-mail: jsader@unimelb.edu.au, & Friend, James R. Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers. United States. doi:10.1063/1.4921192.
Sader, John E., E-mail: jsader@unimelb.edu.au, and Friend, James R. Fri . "Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers". United States. doi:10.1063/1.4921192.
@article{osti_22392521,
title = {Note: Improved calibration of atomic force microscope cantilevers using multiple reference cantilevers},
author = {Sader, John E., E-mail: jsader@unimelb.edu.au and Friend, James R.},
abstractNote = {Overall precision of the simplified calibration method in J. E. Sader et al., Rev. Sci. Instrum. 83, 103705 (2012), Sec. III D, is dominated by the spring constant of the reference cantilever. The question arises: How does one take measurements from multiple reference cantilevers, and combine these results, to improve uncertainty of the reference cantilever’s spring constant and hence the overall precision of the method? This question is addressed in this note. Its answer enables manufacturers to specify of a single set of data for the spring constant, resonant frequency, and quality factor, from measurements on multiple reference cantilevers. With this data set, users can trivially calibrate cantilevers of the same type.},
doi = {10.1063/1.4921192},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 5,
volume = 86,
place = {United States},
year = {2015},
month = {5}
}