Rapid measurement of charged particle beam profiles using a current flux grating

Journal Article · Sun Feb 15 00:00:00 EST 2015 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4907346· OSTI ID:22392354

Paul, Samit; Chowdhury, Abhishek; Bhattacharjee, Sudeep ^[1]

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1. Department of Physics, Indian Institute of Technology, Kanpur 208016, UP (India)

The principle and physics issues of charged particle beam diagnostics using a current flux grating are presented. Unidirectional array of conducting channels with interstitial insulating layers of spacing d is placed in the beam path to capture flux of charge and electronically reproduce an exact beam current profile with density variation. The role of secondary electrons due to the impinging particle beam (both electron and ion) on the probe is addressed and a correction factor is introduced. A 2-dimensional profile of the electron beam is obtained by rotating the probe about the beam axis. Finally, a comparison of measured beam profile with a Gaussian is presented.

• OSTI ID: 22392354
• Journal Information: Review of Scientific Instruments, Vol. 86, Issue 2; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BEAM CURRENTS
BEAM PROFILES
CHARGED PARTICLES
CORRECTIONS
ELECTRON BEAMS
ELECTRONS
GRATINGS
LAYERS