Synthesis, structure, and properties of a novel metallic nickel(III) oxide in the Ce{sub 2-x}Sr{sub x}NiO{sub 4-{delta}} system: CeSr{sub 7}Ni{sub 4}O{sub 15}
- Univ. of Cambridge (United Kingdom)
The first quaternary cerium strontium nickel oxide, CeSr{sub 7}Ni{sub 4}O{sub 15}, corresponding to the x = 1.75 composition in the Ce{sub 2-x}Sr{sub x}NiO{sub 4-{delta}} system has been prepared. Thermogravimetric analysis confirms that Ce(IV) and Ni(III) are present. Rietveld refinement using powder X-ray diffraction data indicates a tetragonal K{sub 2}NiF{sub 4} type structure (Z = {1/2}, {alpha} = 3.7999(1) {angstrom}, c = 12.3630(2) {angstrom}, space group I4/mmm), with Ce{sup 4+} and Sr{sup 2+} disordered over the K sites. Magnetic susceptibility data show Curie-Weiss behavior in the range 6-300 K with a low value of the effective magnetic moment (0.50 {mu}{sub B} per Ni{sup 3+} ion). Electrical resistivity measurements demonstrate that CeSr{sub 7}Ni{sub 4}O{sub 15} is a metallic conductor although the related phase YSr{sub 5}Ni{sub 3}O{sub 11} is semiconducting. 19 refs., 6 figs., 3 tabs.
- OSTI ID:
- 223914
- Journal Information:
- Chemistry of Materials, Journal Name: Chemistry of Materials Journal Issue: 12 Vol. 7; ISSN CMATEX; ISSN 0897-4756
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
CERIUM OXIDES
CHEMICAL PREPARATION
CRYSTAL STRUCTURE
ELECTRIC CONDUCTIVITY
MAGNETIC SUSCEPTIBILITY
NICKEL OXIDES
PHYSICAL PROPERTIES
STOICHIOMETRY
STRONTIUM OXIDES
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0000-0013 K
TEMPERATURE RANGE 0013-0065 K
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TETRAGONAL LATTICES
THERMAL GRAVIMETRIC ANALYSIS
X-RAY DIFFRACTION
CERIUM OXIDES
CHEMICAL PREPARATION
CRYSTAL STRUCTURE
ELECTRIC CONDUCTIVITY
MAGNETIC SUSCEPTIBILITY
NICKEL OXIDES
PHYSICAL PROPERTIES
STOICHIOMETRY
STRONTIUM OXIDES
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0000-0013 K
TEMPERATURE RANGE 0013-0065 K
TEMPERATURE RANGE 0065-0273 K
TEMPERATURE RANGE 0273-0400 K
TETRAGONAL LATTICES
THERMAL GRAVIMETRIC ANALYSIS
X-RAY DIFFRACTION