PATCHY ACCRETION DISKS IN ULTRA-LUMINOUS X-RAY SOURCES
- Department of Astronomy, University of Michigan, 500 Church Street, Ann Arbor, MI 48109-1042 (United States)
- Universite de Toulouse, UPS-OMP, IRAP, F- 31100 Toulouse (France)
- Cahill Center for Astronomy and Astrophysics, California Institute of Technology, Pasadena, CA 91125 (United States)
The X-ray spectra of the most extreme ultra-luminous X-ray sources—those with L ≥ 10{sup 40} erg s{sup –1}—remain something of a mystery. Spectral roll-over in the 5-10 keV band was originally detected in the deepest XMM-Newton observations of the brightest sources; this is confirmed in subsequent NuSTAR spectra. This emission can be modeled via Comptonization, but with low electron temperatures (kT{sub e} ≅ 2 keV) and high optical depths (τ ≅ 10) that pose numerous difficulties. Moreover, evidence of cooler thermal emission that can be fit with thin disk models persists, even in fits to joint XMM-Newton and NuSTAR observations. Using NGC 1313 X-1 as a test case, we show that a patchy disk with a multiple temperature profile may provide an excellent description of such spectra. In principle, a number of patches within a cool disk might emit over a range of temperatures, but the data only require a two-temperature profile plus standard Comptonization, or three distinct blackbody components. A mechanism such as the photon bubble instability may naturally give rise to a patchy disk profile, and could give rise to super-Eddington luminosities. It is possible, then, that a patchy disk (rather than a disk with a standard single-temperature profile) might be a hallmark of accretion disks close to or above the Eddington limit. We discuss further tests of this picture and potential implications for sources such as narrow-line Seyfert-1 galaxies and other low-mass active galactic nuclei.
- OSTI ID:
- 22365917
- Journal Information:
- Astrophysical Journal Letters, Vol. 785, Issue 1; Other Information: Country of input: International Atomic Energy Agency (IAEA); ISSN 2041-8205
- Country of Publication:
- United States
- Language:
- English
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