Coherent phonon study of (GeTe){sub l}(Sb{sub 2}Te{sub 3}){sub m} interfacial phase change memory materials
- Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba Central 4, 1-1-1 Higashi, Tsukuba 305-8562 (Japan)
- Institute of Applied Physics, University of Tsukuba, 1-1-1 Tennodai, Tsukuba 305-8573 (Japan)
The time-resolved reflectivity measurements were carried out on the interfacial phase change memory (iPCM) materials ([(GeTe){sub 2}(Sb{sub 2}Te{sub 3}){sub 4}]{sub 8} and [(GeTe){sub 2}(Sb{sub 2}Te{sub 3}){sub 1}]{sub 20}) as well as conventional Ge{sub 2}Sb{sub 2}Te{sub 5} alloy at room temperature and above the RESET-SET phase transition temperature. In the high-temperature phase, coherent phonons were clearly observed in the iPCM samples while drastic attenuation of coherent phonons was induced in the alloy. This difference strongly suggests the atomic rearrangement during the phase transition in iPCMs is much smaller than that in the alloy. These results are consistent with the unique phase transition model in which a quasi-one-dimensional displacement of Ge atoms occurs for iPCMs and a conventional amorphous-crystalline phase transition takes place for the alloy.
- OSTI ID:
- 22350889
- Journal Information:
- Applied Physics Letters, Vol. 105, Issue 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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