A facile approach to prepare graphene via solvothermal reduction of graphite oxide

Journal Article · Tue Jul 01 04:00:00 EDT 2014 · Materials Research Bulletin

DOI:https://doi.org/10.1016/J.MATERRESBULL.2014.04.016· OSTI ID:22348669

Yuan, Bihe ^[1]; Bao, Chenlu ^[1]; Qian, Xiaodong; Wen, Panyue ^[1]; Xing, Weiyi; Song, Lei ^[1]; Hu, Yuan ^[1]

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1. State Key Laboratory of Fire Science, University of Science and Technology of China, Hefei 230026 (China)

Highlights: • Graphene was prepared via a novel and facile solvothermal reduction method for graphite oxide. • Most of the oxygen functional groups of graphite oxide were removed. • The reduced graphene oxide obtained was featured with bilayer nanosheets. - Abstract: In this work, a facile reduction strategy is reported for the fabrication of graphene. Graphite oxide (GO) is reduced via a novel solvothermal reaction in a mixed solution of acetone and sodium hypochlorite (NaClO). The structure, surface chemistry, morphology and thermal stability of the as-prepared reduced graphene oxide (RGO) are characterized by X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, transmission electron microscopy (TEM), atomic force microscopy (AFM), thermogravimetric analysis (TGA) and X-ray photoelectron spectroscopy (XPS). The results indicate that most of the oxygenated groups in GO are effectively removed in this solvothermal reaction. The novel reduction method provides a simple, cost-effective and efficient strategy for the fabrication of graphene.

• OSTI ID: 22348669
• Journal Information: Materials Research Bulletin, Journal Name: Materials Research Bulletin Vol. 55; ISSN MRBUAC; ISSN 0025-5408
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
77 NANOSCIENCE AND NANOTECHNOLOGY
ATOMIC FORCE MICROSCOPY
FABRICATION
FOURIER TRANSFORM SPECTROMETERS
FOURIER TRANSFORMATION
GRAPHENE
GRAPHITE
INFRARED SPECTRA
NANOSTRUCTURES
OXIDES
OXYGEN
RAMAN SPECTROSCOPY
SYNTHESIS
THERMAL GRAVIMETRIC ANALYSIS
TRANSMISSION ELECTRON MICROSCOPY
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY