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Title: Large anomalous Hall effect in ferromagnetic insulator-topological insulator heterostructures

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4892353· OSTI ID:22314524
;  [1]; ;  [2];  [3];  [4]
  1. Department of Physics, Princeton University, Princeton, New Jersey 08544 (United States)
  2. Department of Chemistry, Princeton University, Princeton, New Jersey 08544 (United States)
  3. Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, New Jersey 08544 (United States)
  4. Hitachi High Technologies America, Inc., Clarksburg, Maryland 20871 (United States)

We demonstrate the van der Waals epitaxy of the topological insulator compound Bi{sub 2}Te{sub 3} on the ferromagnetic insulator Cr{sub 2}Ge{sub 2}Te{sub 6}. The layers are oriented with (001)Bi{sub 2}Te{sub 3}||(001)Cr{sub 2}Ge{sub 2}Te{sub 6} and (110)Bi{sub 2}Te{sub 3}||(100)Cr{sub 2}Ge{sub 2}Te{sub 6}. Cross-sectional transmission electron microscopy indicates the formation of a sharp interface. At low temperatures, bilayers consisting of Bi{sub 2}Te{sub 3} on Cr{sub 2}Ge{sub 2}Te{sub 6} exhibit a large anomalous Hall effect (AHE). Tilted field studies of the AHE indicate that the easy axis lies along the c-axis of the heterostructure, consistent with magnetization measurements in bulk Cr{sub 2}Ge{sub 2}Te{sub 6}. The 61 K Curie temperature of Cr{sub 2}Ge{sub 2}Te{sub 6} and the use of near-stoichiometric materials may lead to the development of spintronic devices based on the AHE.

OSTI ID:
22314524
Journal Information:
Applied Physics Letters, Vol. 105, Issue 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English