Time-resolved x-ray diffraction techniques for bulk polycrystalline materials under dynamic loading
- Department of Materials Science and Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States)
- Department of NanoEngineering, University of California San Diego, La Jolla, California 92093 (United States)
- Oak Ridge Institute for Science and Education, Oak Ridge, Tennessee 37830 (United States)
- US Army Research Laboratory, Aberdeen Proving Ground, Aberdeen, Maryland 21005 (United States)
- Department of Physics, Cornell University, Ithaca, New York 14853 (United States)
- Cornell High Energy Synchrotron Source (CHESS), Cornell University, Ithaca, New York 14853 (United States)
- Department of Mechanical Engineering, Johns Hopkins University, Baltimore, Maryland 21218 (United States)
- X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
We have developed two techniques for time-resolved x-ray diffraction from bulk polycrystalline materials during dynamic loading. In the first technique, we synchronize a fast detector with loading of samples at strain rates of ∼10{sup 3}–10{sup 4} s{sup −1} in a compression Kolsky bar (split Hopkinson pressure bar) apparatus to obtain in situ diffraction patterns with exposures as short as 70 ns. This approach employs moderate x-ray energies (10–20 keV) and is well suited to weakly absorbing materials such as magnesium alloys. The second technique is useful for more strongly absorbing materials, and uses high-energy x-rays (86 keV) and a fast shutter synchronized with the Kolsky bar to produce short (∼40 μs) pulses timed with the arrival of the strain pulse at the specimen, recording the diffraction pattern on a large-format amorphous silicon detector. For both techniques we present sample data demonstrating the ability of these techniques to characterize elastic strains and polycrystalline texture as a function of time during high-rate deformation.
- OSTI ID:
- 22314454
- Journal Information:
- Review of Scientific Instruments, Vol. 85, Issue 9; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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