Double-sided Tl{sub 2}Ba{sub 2}Ca{sub 2}Cu{sub 3}O{sub 10} thin films based high temperature superconducting filter operating above 100 K
- College of Electronic Information and Optical Engineering, Nankai University, Tianjin 300071 (China)
A high temperature superconducting (HTS) filter on double-sided Tl{sub 2}Ba{sub 2}Ca{sub 2}Cu{sub 3}O{sub 10} (Tl-2223) thin films is designed in this letter. High-quality double-sided Tl-2223 thin films are prepared on 10 × 10 × 0.5 mm{sup 3} LaAlO{sub 3} (001) substrate. The critical temperatures T{sub c} of the films are 120 ± 1 K and the critical current densities J{sub c} are 3–4 MA/cm{sup 2} at 77 K for both sides. X-ray diffraction θ-2θ scans and rotational ϕ-scans prove that the films are strongly textured with the c axis perpendicular to the substrate surface. A 3-pole band-pass filter is then fabricated on the Tl-2223 thin films with 4% relative bandwidth and a center frequency of 4.0 GHz. At 77 K, 100 K, and 102 K, the insertion loss in the passband is 0.088 dB, 0.21 dB, and 0.27 dB, respectively. These performances show that the proposed HTS filter is satisfying even when the operating temperature is above 100 K, which makes it possible to work in outer space without cryogenic systems.
- OSTI ID:
- 22311029
- Journal Information:
- Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 9 Vol. 105; ISSN APPLAB; ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BARIUM COMPOUNDS
CALCIUM COMPOUNDS
CRITICAL CURRENT
CRITICAL TEMPERATURE
CUPRATES
CURRENT DENSITY
FILTERS
HIGH-TC SUPERCONDUCTORS
LANTHANUM COMPOUNDS
SUBSTRATES
SURFACES
TEMPERATURE RANGE 0065-0273 K
THALLIUM COMPOUNDS
THIN FILMS
X-RAY DIFFRACTION
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BARIUM COMPOUNDS
CALCIUM COMPOUNDS
CRITICAL CURRENT
CRITICAL TEMPERATURE
CUPRATES
CURRENT DENSITY
FILTERS
HIGH-TC SUPERCONDUCTORS
LANTHANUM COMPOUNDS
SUBSTRATES
SURFACES
TEMPERATURE RANGE 0065-0273 K
THALLIUM COMPOUNDS
THIN FILMS
X-RAY DIFFRACTION