Evidence of radicals created by plasma in bacteria in water
- Department of Plasma Bioscience and Display, Kwangwoon University, 20 Kwangwoon-gil, Nowon-gu, Seoul 139-701 (Korea, Republic of)
- Department of Electrical and Biological Physics, Kwangwoon University, 20 Kwangwoon-gil, Nowon-gu, Seoul 139-701 (Korea, Republic of)
- High Technology Components and Materials Research Center, Korea Basic Science Institute, 1275 Jisa-dong, Gangseo-gu, Busan 618-230 (Korea, Republic of)
Heavy water (D{sub 2}O) was introduced into a non-thermal plasma-jet (NTPJ) device to generate deuterium monoxide (OD) radicals at room temperature. Owing to the similar reactivity and low prevalence of deuterium in nature, OD radicals can be utilized to visualize the OH radical interactions with water and living cells. Escherichia coli in water were treated with OD radicals, and D atom incorporation into cells was visualized using time-of-flight SIMS and Nano-SIMS. The results show that D atoms from NTPJ reach the cytoplasm of E. coli in H{sub 2}O, indicating the usefulness of this OD-tracking method for the study of radical interactions with living cells.
- OSTI ID:
- 22310924
- Journal Information:
- Applied Physics Letters, Vol. 105, Issue 7; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
37 INORGANIC
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BIOLOGICAL EFFECTS
CYTOPLASM
DEUTERIUM
ESCHERICHIA COLI
HEAVY WATER
HYDROXYL RADICALS
INTERACTIONS
ION MICROPROBE ANALYSIS
MASS SPECTROSCOPY
PLASMA JETS
REACTIVITY
TEMPERATURE RANGE 0273-0400 K
TIME-OF-FLIGHT METHOD
ORGANIC
PHYSICAL AND ANALYTICAL CHEMISTRY
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
BIOLOGICAL EFFECTS
CYTOPLASM
DEUTERIUM
ESCHERICHIA COLI
HEAVY WATER
HYDROXYL RADICALS
INTERACTIONS
ION MICROPROBE ANALYSIS
MASS SPECTROSCOPY
PLASMA JETS
REACTIVITY
TEMPERATURE RANGE 0273-0400 K
TIME-OF-FLIGHT METHOD