Soft x-ray intensity profile measurements of electron cyclotron heated plasmas using semiconductor detector arrays in GAMMA 10 tandem mirror

Journal Article · Sat Nov 15 00:00:00 EST 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4885495· OSTI ID:22308793

Imai, T.; Kariya, T.; Numakura, T.; Eguchi, T.; Kawarasaki, R.; Nakazawa, K.; Kato, T.; Sato, F.; Nanzai, H.; Uehara, M.; Endo, Y.; Ichimura, M. ^[1]

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1. Plasma Research Center, University of Tsukuba, Tsukuba, Ibaraki 305-8577 (Japan)

Temporally and spatially resolved soft x-ray analyses of electron cyclotron heated plasmas are carried out by using semiconductor detector arrays in the GAMMA 10 tandem mirror. The detector array has 16-channel for the measurements of plasma x-ray profiles so as to make x-ray tomographic reconstructions. The characteristics of the detector array make it possible to obtain spatially resolved plasma electron temperatures down to a few tens eV and investigate various magnetohydrodynamic activities. High power electron cyclotron heating experiment for the central-cell region in GAMMA 10 has been started in order to reduce the electron drag by increasing the electron temperature.

• OSTI ID: 22308793
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

70 PLASMA PHYSICS AND FUSION TECHNOLOGY
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DRAG
ECR HEATING
ELECTRON TEMPERATURE
EV RANGE
GAMMA 10 DEVICES
PLASMA
SEMICONDUCTOR DETECTORS
SOFT X RADIATION