Fs-laser processing of polydimethylsiloxane

Journal Article · Mon Jul 14 00:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4887812· OSTI ID:22308707

Nedyalkov, Nikolay N. ^[1]; Valova, Eugenia I.; Georgieva, Zhenya S.; Armyanov, Stefan A.; Kolev, Konstantin N. ^[2]; Amoruso, Salvatore; Wang, Xuan; Bruzzese, Ricardo ^[3]; Sawczak, Miroslaw; Śliwiński, Gerard ^[4]

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1. Institute of Electronics, Bulgarian Academy of Sciences, 72 Tsarigradsko Shose, Sofia 1784 (Bulgaria)
2. Rostislaw Kaischew Institute of Physical Chemistry, Bulgarian Academy of Sciences, Acad. G. Bonchev Str., Block 11, Sofia 1113 (Bulgaria)
3. CNR-SPIN, Dipartimento di Scienze Fisiche, Universita degli Studi di Napoli Federico II, Complesso Universitario di Monte S. Angelo, Via Cintia, I-80126 Napoli (Italy)
4. Photophysics Department, The Szewalski Institute, Polish Academy of Sciences, 14 Fiszera St, 80-231 Gdańsk (Poland)

We present an experimental analysis on surface structuring of polydimethylsiloxane films with UV (263 nm) femtosecond laser pulses, in air. Laser processed areas are analyzed by optical microscopy, SEM, and μ-Raman spectroscopy. The laser-treated sample shows the formation of a randomly nanostructured surface morphology. μ-Raman spectra, carried out at both 514 and 785 nm excitation wavelengths, prior and after laser treatment allow evidencing the changes in the sample structure. The influence of the laser fluence on the surface morphology is studied. Finally, successful electro-less metallization of the laser-processed sample is achieved, even after several months from the laser-treatment contrary to previous observation with nanosecond pulses. Our findings address the effectiveness of fs-laser treatment and chemical metallization of polydimethylsiloxane films with perspective technological interest in micro-fabrication devices for MEMS and nano-electromechanical systems.

• OSTI ID: 22308707
• Journal Information: Journal of Applied Physics, Vol. 116, Issue 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
EXCITATION
FILMS
LASER RADIATION
MEMS
NANOSTRUCTURES
OPTICAL MICROSCOPY
RAMAN SPECTRA
RAMAN SPECTROSCOPY
RANDOMNESS
SCANNING ELECTRON MICROSCOPY
SURFACES
WAVELENGTHS