Microwave losses in MgO, LaAlO{sub 3}, and (La{sub 0.3}Sr{sub 0.7})(Al{sub 0.65}Ta{sub 0.35})O{sub 3} dielectrics at low power and in the millikelvin temperature range

Journal Article · Mon May 26 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4880357· OSTI ID:22300151

Arzeo, M.; Lombardi, F.

We have investigated both the temperature and the power dependence of microwave losses for various dielectrics commonly used as substrates for the growth of high critical temperature superconductor thin films. We present measurement of niobium superconducting λ∕2 coplanar waveguide resonators, fabricated on MgO, LaAlO{sub 3}, and (La{sub 0.3}Sr{sub 0.7})(Al{sub 0.65}Ta{sub 0.35})O{sub 3} (LSAT), at the millikelvin temperature range and at low input power. By comparing our results with the two-level system model, we have discriminated among different dominant loss mechanisms. LSAT has shown the best results as regards the dielectric losses in the investigated regimes.

• OSTI ID: 22300151
• Journal Information: Applied Physics Letters, Vol. 104, Issue 21; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALUMINATES
CRITICAL TEMPERATURE
DIELECTRIC MATERIALS
LANTHANUM COMPOUNDS
LOSSES
MAGNESIUM OXIDES
MICROWAVE RADIATION
NIOBIUM
STRONTIUM COMPOUNDS
SUPERCONDUCTORS
TANTALUM COMPOUNDS
TEMPERATURE DEPENDENCE
TEMPERATURE RANGE 0000-0013 K
THIN FILMS
WAVEGUIDES