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Title: In situ X-ray ptychography imaging of high-temperature CO{sub 2} acceptor particle agglomerates

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4884598· OSTI ID:22299887
; ; ; ; ;  [1];  [2];  [3]
  1. Department of Chemical Engineering, Norwegian University of Science and Technology (NTNU), Sem Sælands vei 4, 7491 Trondheim (Norway)
  2. Paul Scherrer Institut, 5232 Villigen (Switzerland)
  3. Department of Energy Conversion and Storage, Technical University of Denmark, Frederiksborgvej 399, 4000 Roskilde (Denmark)

Imaging nanoparticles under relevant reaction conditions of high temperature and gas pressure is difficult because conventional imaging techniques, like transmission electron microscopy, cannot be used. Here we demonstrate that the coherent diffractive imaging technique of X-ray ptychography can be used for in situ phase contrast imaging in structure studies at atmospheric pressure and elevated temperatures. Lithium zirconate, a candidate CO{sub 2} capture material, was studied at a pressure of one atmosphere in air and in CO{sub 2}, at temperatures exceeding 600 °C. Images with a spatial resolution better than 200 nm were retrieved, and possibilities for improving the experiment are described.

OSTI ID:
22299887
Journal Information:
Applied Physics Letters, Vol. 104, Issue 24; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English