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Title: Layer-Dependent Magnetism and Spin Fluctuations in Atomically Thin van der Waals Magnet CrPS4

Journal Article · · Nano Letters
ORCiD logo [1];  [2];  [1];  [3];  [1];  [4];  [1];  [1];  [3];  [2]; ORCiD logo [1]
  1. University of California, San Diego, La Jolla, CA (United States); Georgia Institute of Technology, Atlanta, GA (United States)
  2. University of California, Los Angeles, CA (United States)
  3. Boston College, Chestnut Hill, MA (United States)
  4. University of California, San Diego, La Jolla, CA (United States)

van der Waals (vdW) magnets, an emerging family of two-dimensional (2D) materials, have received tremendous attention due to their rich fundamental physics and significant potential for cutting-edge technological applications. In contrast to the conventional bulk counterparts, vdW magnets exhibit significant tunability of local material properties, such as stacking engineered interlayer coupling and layer-number dependent magnetic and electronic interactions, which promise to deliver previously unavailable merits to develop multifunctional microelectronic devices. As a further ingredient of this emerging topic, here we report nanoscale quantum sensing and imaging of atomically thin vdW magnet chromium thiophosphate CrPS4, revealing its characteristic layer-dependent 2D static magnetism and dynamic spin fluctuations. We also show a large tunneling magnetoresistance in CrPS4-based spin filter vdW heterostructures. Here, the excellent material stability, robust strategy against environmental degradation, in combination with tailored magnetic properties highlight the potential of CrPS4 in developing state-of-the-art 2D spintronic devices for next-generation information technologies.

Research Organization:
Univ. of California, San Diego, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
Grant/Contract Number:
SC0022946; SC0021117; NSF DMR-2144086; DMR-2046227
OSTI ID:
2229570
Journal Information:
Nano Letters, Vol. 23, Issue 17; ISSN 1530-6984
Publisher:
American Chemical SocietyCopyright Statement
Country of Publication:
United States
Language:
English

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