Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities
Journal Article
·
· Surface and Interface Analysis
- Casa Software Ltd, Teignmouth (United Kingdom)
- The Institute for Research on Catalysis and the Environment of Lyon (IRCELYON), Villeurbanne (France)
- Lehigh Univ., Bethlehem, PA (United States)
Adventitious carbon contaminations are not only omnipresent and used for charge referencing of XPS spectra but also can alter the apparent presence of the element peaks that span over the large spectral window of binding energies. This Insight note describes the effect of an adventitious contamination layer on Pt and presents, in brief, the approach whereby the component spectra are derived for ion beam cleaned Pt samples that can then utilize linear mathematics to peak fit said spectra thus quantifying the amount of each component including that assigned to the contamination itself of Pt metal.
- Research Organization:
- Georgia Institute of Technology, Atlanta, GA (United States)
- Sponsoring Organization:
- Centre National de la Recherche Scientifique; USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- SC0012577
- OSTI ID:
- 2228527
- Alternate ID(s):
- OSTI ID: 2228529
OSTI ID: 2575931
- Journal Information:
- Surface and Interface Analysis, Journal Name: Surface and Interface Analysis Journal Issue: 2 Vol. 56; ISSN 1096-9918; ISSN 0142-2421
- Publisher:
- WileyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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