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Surface analysis insight note: Illustrating the effect of adventitious contamination on Pt photoemission peak intensities

Journal Article · · Surface and Interface Analysis
DOI:https://doi.org/10.1002/sia.7276· OSTI ID:2228527
 [1];  [2];  [3]
  1. Casa Software Ltd, Teignmouth (United Kingdom)
  2. The Institute for Research on Catalysis and the Environment of Lyon (IRCELYON), Villeurbanne (France)
  3. Lehigh Univ., Bethlehem, PA (United States)
Adventitious carbon contaminations are not only omnipresent and used for charge referencing of XPS spectra but also can alter the apparent presence of the element peaks that span over the large spectral window of binding energies. This Insight note describes the effect of an adventitious contamination layer on Pt and presents, in brief, the approach whereby the component spectra are derived for ion beam cleaned Pt samples that can then utilize linear mathematics to peak fit said spectra thus quantifying the amount of each component including that assigned to the contamination itself of Pt metal.
Research Organization:
Georgia Institute of Technology, Atlanta, GA (United States)
Sponsoring Organization:
Centre National de la Recherche Scientifique; USDOE; USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
SC0012577
OSTI ID:
2228527
Alternate ID(s):
OSTI ID: 2228529
OSTI ID: 2575931
Journal Information:
Surface and Interface Analysis, Journal Name: Surface and Interface Analysis Journal Issue: 2 Vol. 56; ISSN 1096-9918; ISSN 0142-2421
Publisher:
WileyCopyright Statement
Country of Publication:
United States
Language:
English

References (8)

Further developments in quantitative X-ray photoelectron spectromicroscopy: preliminary results from the study of germanium corrosion journal January 2006
Simple universal curve for the energy-dependent electron attenuation length for all materials: Simple, accurate, universal expression for attenuation lengths journal May 2012
Film thickness measurement and contamination layer correction for quantitative XPS journal January 2016
Systematic and collaborative approach to problem solving using X-ray photoelectron spectroscopy journal September 2021
A study of in situ reduction of MoO3 to MoO2 by X-ray Photoelectron Spectroscopy journal October 2022
Combining PCA and nonlinear fitting of peak models to re-evaluate C 1s XPS spectrum of cellulose journal March 2023
Evaluation of a simple correction for the hydrocarbon contamination layer in quantitative surface analysis by XPS journal July 2005
XPS and SEM-EDX Study of Electrolyte Nature Effect on Li Electrode in Lithium Metal Batteries journal October 2018