Entanglement-assisted electron microscopy based on a flux qubit
- Department of Electronics and Information Systems, Akita Prefectural University, Yurihonjo 015-0055 (Japan)
- National Institute for Physiological Sciences, Okazaki 444-8787 (Japan)
A notorious problem in high-resolution biological electron microscopy is radiation damage caused by probe electrons. Hence, acquisition of data with minimal number of electrons is of critical importance. Quantum approaches may represent the only way to improve the resolution in this context, but all proposed schemes to date demand delicate control of the electron beam in highly unconventional electron optics. Here we propose a scheme that involves a flux qubit based on a radio-frequency superconducting quantum interference device, inserted in a transmission electron microscope. The scheme significantly improves the prospect of realizing a quantum-enhanced electron microscope for radiation-sensitive specimens.
- OSTI ID:
- 22283155
- Journal Information:
- Applied Physics Letters, Vol. 104, Issue 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRON BEAMS
ELECTRON MICROSCOPES
ELECTRONS
MAGNETIC FLUX
QUANTUM ENTANGLEMENT
QUBITS
RADIATION EFFECTS
RADIOWAVE RADIATION
RESOLUTION
SQUID DEVICES
SUPERCONDUCTORS
TRANSMISSION ELECTRON MICROSCOPY