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Title: Synthesis, magnetic and electric transport properties of mixed-valence manganites La{sub 0.5+x}Sr{sub 1.5−x}Mn{sub 0.5}Cr{sub 0.5}O{sub 4} (x=0.1, 0.2 and 0.3)

Journal Article · · Journal of Solid State Chemistry

A series of mixed-valence manganites La{sub 0.5+x}Sr{sub 1.5−x}Mn{sub 0.5}Cr{sub 0.5}O{sub 4} were synthesized by sol–gel method. Rietveld profile analysis shows that the phases crystallize with tetragonal unit cell in the space group I4/mmm. The lattice parameter c increases with increase in x while a parameter almost remains constant. The Weiss constant (θ) is positive for all the phases and found to increase with increase in x. The ferromagnetic interactions becomes more dominant with increase in x due to increase in Mn{sup 3+}–O–Mn{sup 4+} and Mn{sup 3+}–O–Cr{sup 3+} double exchange interactions. Resistivity can be described by the polaron hopping and the variable range hopping model. It was found that the transport mechanism is dominated by Mott's variable range hopping (VRH) model with a decrease of Mott localization energy with increase in x, which explains the decrease of resistivity. - Graphical abstract: Unit cell structure of La{sub 0.6}Sr{sub 1.4}Mn{sub 0.5}Cr{sub 0.5}O{sub 4}. Display Omitted Research highlights: • A series of K{sub 2}NiF{sub 4}-type compounds La{sub 0.5}+xSr{sub 1.5-x}Mn{sub 0.5}Cr{sub 0.5}O{sub 4} (x=0.1, 0.2, 0.3) have been synthesized. • The calculated tolerance factors confirms the tetragonal symmetry of the proposed phases. • The lattice parameter c increases with increase in x while a parameter almost remains constant. • The Weiss constant (θ) is positive for all the phases and found to increase with increase in x • The resistivity data has been best fitted using the Mott's variable range hopping (VRH) model.

OSTI ID:
22274154
Journal Information:
Journal of Solid State Chemistry, Vol. 207; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English